Saint Leo Welcomes Florida Academy of Sciences
March 19, 2015
Saint Leo will host the Florida Academy of Sciences annual meeting Friday, March 20, at University Campus.
The academy meeting brings together Florida college faculty and other specialists from the social sciences, biological sciences, physical sciences, science education community, and the fields of engineering, computing, and mathematics to present research findings, and interact with their peers. In some cases, undergraduates are also presenting research findings.
The current Spring Break allows the university to lend its facilities to the academy’s many annual meeting activities.
On-site registration will begin at 7:30 a.m. in Lewis Hall, the three-story science building immediately apparent on the right as one drives into campus. Saint Leo University President Arthur F. Kirk, Jr., will welcome guests at 8:30 a.m. in Selby Auditorium, which is in Lewis Hall.
Academy members and guests (including some from the Saint Leo community) will present scholarly papers and research findings during the morning and afternoon. Academic posters will be on display from 5:30 to 7:30 p.m.
A plenary session at 4:30 p.m. will feature Dr. Jack Ballantyne, professor of chemistry at the University of Central Florida (UCF) and associate director for research at the National Center for Forensic Science in Orlando. He will describe initiatives at the center that apply genomics—the study of genes and their functions—to the field of forensics.
During an evening banquet for academy members, Dr. Peter Delfyett, a UCF professor and researcher in the fields of physics, optics, and photonics, will discuss uses of new and faster light-based technologies. Dr. Deflyett was honored by the Florida Academy of Sciences in 2014 for his contributions to science.
On Saturday, March 21, Saint Leo will host the Florida Junior Academy of Sciences. This is the division of the academy for middle school and high school students, and provides them with a variety of opportunities to explore science in depth.